2001 Journal Publications

46. Y.-P. Zhao, B. Q. Wei, P. M. Ajayan, G. Ramanath , T.-M. Lu, G.-C. Wang, A. Rubio, and S. Roche, “Frequency-dependent electrical transport in carbon nanotubes,” Phys. Rev. B 64, 201402(R) (2001).

45. Jason T. Drotar, B. Q. Wei, Y.-P. Zhao, G. Ramanath , P. M. Ajayan, T.-M. Lu, and G.-C. Wang, “Reflection high-energy electron diffraction from carbon nanotubes,” Phys. Rev. B. 64, 125417 (2001).

44. Y.-P. Zhao, Jason T. Drotar, T.-M. Lu, and G.-C. Wang, “Morphology transition during low pressure chemical vapor deposition,” Phys. Rev. Lett. 87, 136102 (2001).

43. Jason T. Drotar, Y.-P. Zhao, T.-M. Lu, and G.-C. Wang, “Surface-roughening in low-pressure chemical vapor deposition,” Phys. Rev. B 64, 125411 (2001).

42. T. Karabacak, Y.-P. Zhao, Jason T. Drotar, G.-C. Wang, and T.-M. Lu, “Growth-front roughening in amorphous silicon films by sputtering,” Phys. Rev. B 64, 085323 (2001).

41. H.-D. Liu, Y.-P. Zhao, G. Ramanath , S. P. Murarka, and G.-C. Wang, In-situ measurement of thickness dependent of electrical resistance of ultrathin Cu films on thick SiO2/Si(100) substrate,” Thin Solid Films384, 151–156 (2001).

40. Y.-P. Zhao, T.-M. Lu, and G.-C. Wang, Reply to Das Sarma's Comment, Phys. Rev. Lett. 86, 2697 (2001).

39. Y.-P. Zhao, R. M. Gamache, G.-C. Wang, T.-M. Lu, G. Palasantzas, and J. Th. M. De Hosson, Effect of surface roughness on magnetic domain wall thickness, domain size, and coercivity,” J. Appl. Phys. 89, 1325 (2001).