Head

Journal Publications before 2000

38. M. Li, Y.-P. Zhao, and G.-C. Wang, In-situ measurement of thickness dependence of electrical resistance of ultrathin Co films on SiO2/Si(111) substrate,” J. Vac. Sci. Tech. A 18, 2992 (2000).

37. Y.-P. Zhao, J. B. Fortin, G. Bonvallet, G.-C. Wang, and T.-M. Lu, Kinetic roughening in vapor deposition polymerization of linear-chain polymer films,” Phys. Rev. Lett. 85, 3229 (2000).

36. T. Karabacak, Y.-P. Zhao, T. Liew, T.-M. Lu, and G.-C. Wang, Anisotropic scaling of hard disk surface structures,” J. Appl. Phys. 88, 3361 (2000).

35. T. Karabacak, Y.-P. Zhao, M. Stowe, B. Quayle, T.-M. Lu, and G.-C. Wang, Large angle in-plane light scattering from rough surfaces,” Appl. Opt. 39, 4658 (2000).

34. Jason T. Drotar, Y.-P. Zhao, T.-M. Lu and G.-C. Wang, Surface roughening in shadowing growth and etching in 2+1 dimensions,” Phys. Rev. B 62, 2118 (2000).

33. G. Palasantzas, Y.-P. Zhao, G.-C. Wang, T.-M. Lu, J. Barnas, and J. Th. M. De Hosson, Electrical conductivity and thin films growth dynamics,” Phys. Rev. B 61, 11109 (2000).

32. G. Palasantzas, Y.-P. Zhao, G.-C. Wang, and J. Th. M. De Hosson, Roughness effects on magnetic properties of thin films,” Physica B 283, 199 (2000).

31. Jason T. Drotar, Y.-P. Zhao, T.-M. Lu, and G.-C. Wang, Mechanisms for plasma and reactive ion etch-front roughening,” Phys. Rev. B 61, 3012 (2000).

30. Y.-P. Zhao, G.-C. Wang, T.-M. Lu, G. Palasantzas, and J. Th. M. De Hosson, Surface roughness effect on capacitance and leakage current of an insulating film,” Phys. Rev. B 60, 9157 (1999).

29. Y.-P. Zhao, J. T. Drotar, G.-C. Wang, and T.-M. Lu, Roughening in plasma etch fronts of Si(100),” Phys. Rev. Lett. 82, 4882 (1999).

28. Y.-P. Zhao, A.R. Hopper, G.-C. Wang, and T.-M. Lu, Monte Carlo simulation of the initial growth stage in vapor deposition polymerization,” Phys. Rev. E 60, 4310 (1999).

27. Y.-P. Zhao, G. Palasantzas, G.-C. Wang, and J. Th. M. De Hosson, Surface/interface roughness induced demagnetizing effect in thin magnetic films,” Phys. Rev. B 60, 1216 (1999).

26. Jason T. Drotar, Y.-P. Zhao, T.-M. Lu, and G.-C. Wang, Numerical analysis of the noisy Kuramoto-Sivashisky equation in 2+1 dimensions,” Phys. Rev. E 59, 177 (1999).

25. Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, Anisotropy in growth front roughening,” Phys. Rev. B 58, 13909 (1998).

24. Y.-P. Zhao, C.-F. Cheng, G.-C. Wang, and T.-M. Lu, Characterization of pitting corrosion in aluminum films by light scattering,” Appl. Phys. Lett. 73, 2432 (1998).

23. G.-R. Yang, Y.-P. Zhao, Y. Z. Hu, T. Paul Chow, and R. Guttmann, XPS and AFM study of chemical mechanical polishing of silicon nitride,” Thin Solid Films 333, 219 (1998).

22. G.-R. Yang, Y.-P. Zhao, and B.-Y. Tong, Studying low-pressure chemical vapor deposition a-Si:B alloys by optical spectroscopy,” J. Vac. Sci. Technol. A 16, 2267 (1998).

21. Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, Diffraction from anisotropic random rough surfaces,” Phys. Rev. B 58, 7300 (1998).

20. Y.-P. Zhao, Irene Wu, C.-F. Cheng, Ueyn Block, G.-C. Wang, and T.-M. Lu, Characterization of random rough surfaces by in-plane light scattering,” J. Appl. Phys. 84, 2571 (1998).

19. T.-M. Lu, G.-C. Wang, and Y.-P. Zhao, Beyond intensity oscillation,” Surface Science Review and Letter 5, 899 (1998).

18. Y.-P. Zhao, C.-F. Cheng, G.-C. Wang, and T.-M. Lu, Power law behavior in diffraction from fractal surfaces,” Surf. Sci. Lett. 409, L703 (1998).

17. G.-R. Yang, Y.-P. Zhao, B. Wang, E. Barnat, J. McDonald, and T.-M. Lu, Chemical interactions at Ta/Fluorinated polymer buried interfaces,” Appl. Phys. Lett. 72, 1846 (1998).

16. M. Li, Y.-P. Zhao, G.-C. Wang and H.-G. Min, Effect of surface roughness on magnetization reversal of Co films on plasma-etched Si(100) substrates,” J. Appl. Phys. 83, 6287 (1998).

15. Y.-P. Zhao, H.-N. Yang, G.-C. Wang, and T.-M. Lu, Diffraction from diffusion barrier induced mound structures in epitaxial growth fronts,” Phys. Rev. B 57 , 1922 (1998).

14. Y. F. Wu, F. Yang, A. M. Xiong, Y.-P. Zhao, and L .M. Zheng, High-spectral-resolution reconstruction of atmospheric Rayleigh-Mie scattering from semi-blind de-convolution,” Acta Optica Sinica 17, 1066 (1997).

13. G.-R. Yang, Y.-P. Zhao, N. Jan, S. Murarka , and R. Guttmann, Chemical‐mechanical polishing of Parylene N and Benzocyclobutene films,” J. Electrochemical Society 144, 3249 (1997).

12. G.-R. Yang, Y.-P. Zhao, N. Jan, S. Murarka , and R. Guttmann, Chemical-mechanical polishing of parylene-N films: evaluation by X-ray photoelectron spectroscopy and atomic force microscopy,” J. Electronic Materials 26, 935 (1997).

11. Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, Diffraction from non-Gaussian rough surfaces,” Phys. Rev. B55, 13938 (1997).

10. H.-N. Yang, Y.-P. Zhao, A. Chan, G.-C. Wang, and T.-M. Lu, Sampling-induced hidden cycles in correlated random rough surface,” Phys. Rev. B 56, 4224 (1997).

9. G.-R. Yang, Y.-P. Zhao, M. Abburi, S. Dabral and B.-Y. Tong, Comparison of low-temperature oxidation of crystalline Si and B with -Si:B alloy: An x-ray photoelectron spectroscopy study,” J. Vac. Sci. Technol. A 15, 279 (1997).

8. H.-N. Yang, Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, Noise-induced roughening evolution of amorphous Si films grown by thermal evaporation,” Phys. Rev. Lett. 76, 3774 (1996).

7. Y.-P. Zhao, Y.-J. Wu, H.-N. Yang, G.-C. Wang, and T.-M. Lu, In situ real-time study of chemical etching process of Si(100) using light scattering,” Appl. Phys. Lett. 69, 221 (1996).

6. Y. P. Zhao, H.-N. Yang, G.-C. Wang, and T.-M. Lu , “Extraction of real-space correlation function of a rough surface by light scattering using diode array detectors,” Appl. Phys. Lett. 68, 3063 (1996).

5. C. C. Roberts, G.-R. Yang, A. Cocoziello, Y.-P. Zhao, G. Wnek, and T.-M. Lu, High electro-optic side-chain polymer by vapor deposition polymerization,” Appl. Phys. Lett. 68, 2067 (1996).

4. Y. P. Zhao, D. L. Zhang, G. L. Kong, G. Q. Pan, and X B. Liao, Evidence for light-induced increase of Si-H bonds in undoped a-Si:H,” Phys. Rev. Lett. 74, 588 (1995).

3. G. L. Kong, D. L. Zhang, Y. P. Zhao, and X. B. Liao, The role of hydrogen and Si-H bonds in the metastability of a-Si:H,” Solid State Phenomena 44 - 46, 677 (1995).

2. Y. F. Wu, Y. P. Zhao , F. Yang, A. M. Xiong, J. X. Tang, and L. M. Zheng, A new method for acquiring high resolution atmospheric Rayleigh-Mie spectrum,” Optical Engineering 34, 1195 (1995).

1. G. L. Kong, D. L. Zhang, Y. P. Zhao , G. S. Sun, G. Q. Pan, and X. B. Liao, A new method for detecting subtle changes in Si-H bonds of a-Si:H,” J. Non-Crystl. Solids 164 - 166, 211 (1993).